Electronic Scanning Microscope (SEM) with EDAX

Microscopio Electrónico de Barrido (SEM) con EDAX
  • Scanning electronic microscope FEI Inspect F50.
  • Electron acceleration potential from 0.2 to 30 kV.
    Magnification from 14 to 1000 000x
  • Catodoluminescence UV-VIS-IR
  • EDX